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  Search result  Your search for [subject]Atomic force microscopy (AFM) returned 2 records.  
 
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  Thesis Single route formation of doped polyaniline/porous silicon heterojunction.

by Lozada, Lou Serafin M.; Quezon City, Philippines: University of the Philippines, 2009.

Subject: Physics; Polyaniline; Atomic force microscopy (AFM); Scanning electron microscopy (SEM); Porous silicon.

  
     
Relevance: 34.99%
 
     
  Analytics Washing durability of cotton coated with a fluorintaed resin: an AFM, XPS, and low frequency mechanical spectroscopy study.

by D. Juhue et al;

Subject: Fabric washing durability; Atomic force microscopy (AFM); X-ray photoelectron spectroscopy (XPS); Low frequency mechanical spectroscopy (LFMS).

  
     
Relevance: 29.38%
 
     
 
         
         
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