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  Search result  Your search for [subject]Electronic measurements--Congresses returned 5 records.  
 
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  Book Recombination lifetime measurements in silicon.

West Conshohocken, PA: ASTM, 1998.

Subject: Semiconductors -- Testing -- Congresses; Service life (Engineering) -- Forecasting -- Congresses; Electronic measurements -- Congresses.

  
     
Relevance: 17.10%
 
     
  Book Recombination lifetime measurements in silicon.

West Conshohocken, PA: ASTM, 1998.

Subject: Semiconductors--Testing--Congresses; Sevice life (Engineering)--Forecasting--Congresses; Electronic measurements--Congresses.

  
     
Relevance: 17.10%
 
     
  Book Conference on refraction effects in geodesy [and] Conference on electronic distance measurement /: P.V. Angus-Leppan.

Kengsington: University of New South Wales, 1969.

Subject: Refraction, Terrestial -- Congresses; Electronic measurements -- Congresses.

  
     
Relevance: 16.17%
 
     
  Book Electrochemical noise measurement for corrosion applications.

West Conshohocken, PA: ASTM, 1996.

Subject: Corrosion and anti-corrosive--Testing--Congresses; Electrolytic corrosion--Testing--Congresses; Potentiometry--Congresses; Electronic measurements--Congresses.

  
     
Relevance: 15.72%
 
     
  Book Electrochemical noise measurement for corrosion applications _ International Symposium on Electrochemical Noise Measurement for Corrosion Applications (1st : 1994 : Montreal, Quebec).

West Conshohocken, PA: ASTM, 1996.

Subject: Corrosion and anti-corrosives -- Testing -- Congresses; Electrolytic corrosion -- Testing -- Congresses; Electronic measurements -- Congresses; Potentiometry -- Congresses.

  
     
Relevance: 15.72%
 
     
 
         
         
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