Search Results       Your search for [subject]Integrated circuits -- Wafer-scale integration -- Design and construction -- Data processing returned 1 record.           Manufacturing yield evaluation of VLSI/WSI systems. Los Alamitos, CA: IEEE Computer Society Press, 1995. Subject: Integrated circuits -- Very large scale integration -- Design and construction -- Data processing; Integrated circuits -- Wafer-scale integration -- Design and construction -- Data processing; Integrated circuits -- Very large scale integration -- Reliability; Integrated circuits -- Wafer-scale integration -- Reliability; Integrated circuits -- Fault tolerance.          Add to Book Cart Relevance: 61.89%