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  Search result  Your search for [subject]Materials -- Cracking -- Measurement returned 2 records.  
 
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  Thesis Understanding the effect of surface flaws on fracture of silicon die.

by Punzalan, Jaime C.; 2003.

Subject: Fracture mechanics; Fractography; Materials -- Cracking -- Measurement; Semiconductor wafers; Silicon crystals.

  
     
Relevance: 21.09%
 
     
  Thesis Understanding the effect of surface flaws on fracture of silicon die.

by Punzalan, Jaime C.; 2003.

Subject: Fracture mechanics; Fractography; Materials -- Cracking -- Measurement; Semiconductor wafers; Silicon crystals.

  
     
Relevance: 21.09%
 
     
 
         
         
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