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Your search for [subject]Scanning electron microscopes returned 3 records. |
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Electron beam testing technology.
New York: Plenum Press, 1993.
Subject: Electron beams -- Industrial applications; Scanning electron microscopes; Semiconductors -- Testing.
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Scanning microscope.
Subject: Scanning electron microscopes.
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The use of the scanning electron microscope.
by Hearle, J. W. S.; Oxford: Pergamon Press, 1972.
Subject: Scanning electron microscopes.
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