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  Search result  Your search for [subject]Scanning electron microscopes returned 3 records.  
 
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  Book Electron beam testing technology.

New York: Plenum Press, 1993.

Subject: Electron beams -- Industrial applications; Scanning electron microscopes; Semiconductors -- Testing.

  
     
Relevance: 28.66%
 
     
  Book Scanning microscope.



Subject: Scanning electron microscopes.

  
     
Relevance: 27.30%
 
     
  Book The use of the scanning electron microscope.

by Hearle, J. W. S.; Oxford: Pergamon Press, 1972.

Subject: Scanning electron microscopes.

  
     
Relevance: 27.30%
 
     
 
         
         
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