Search Results       Your search for [subject]Semiconductor storage devices -- Testing returned 1 record.           Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. by Bushnell, Michael L., (Michael Lee), 1950-; New York, N.Y.: Springer, 2000. Subject: Integrated circuits -- Very large scale integration -- Testing; Digital integrated circuits -- Testing; Mixed signal circuits -- Testing; Semiconductor storage devices -- Testing.          Add to Book Cart Relevance: 24.60%