Search Results
 
  Search result  Your search for [subject]Semiconductors -- Testing returned 7 records.  
 
Sort by:  
 
     
  Book Integrated circuit failure analysis : a guide to preparation techniques.

by Beck, Friedrich; Chichester: Wiley, 1998.

Subject: Semiconductors -- Failures; Semiconductors -- Testing.

  
     
Relevance: 14.71%
 
     
  Book Principles of semiconductor network testing.

by Afshar, Amir; Boston: Butterworth-Heinemann, 1995.

Subject: Integrated circuits -- Testing; Semiconductors -- Testing.

  
     
Relevance: 14.02%
 
     
  Book Semiconductor material and device characterization.

by Schroder, Dieter K.; New York: Wiley, 1990.

Subject: Semiconductors -- Testing; Semiconductors.

  
     
Relevance: 13.60%
 
     
  Book Electrical characterization of GaAs materials and devices.

by Look, D. C., (David C.), 1938-; Chichester: Wiley, 1989.

Subject: Gallium arsenide semiconductors -- Testing; Magnetoresistance.

  
     
Relevance: 12.62%
 
     
  Book Electron beam testing technology.

New York: Plenum Press, 1993.

Subject: Electron beams -- Industrial applications; Scanning electron microscopes; Semiconductors -- Testing.

  
     
Relevance: 11.25%
 
     
  Book Recombination lifetime measurements in silicon.

West Conshohocken, PA: ASTM, 1998.

Subject: Semiconductors -- Testing -- Congresses; Service life (Engineering) -- Forecasting -- Congresses; Electronic measurements -- Congresses.

  
     
Relevance: 10.78%
 
     
  Book Recombination lifetime measurements in silicon.

West Conshohocken, PA: ASTM, 1998.

Subject: Semiconductors--Testing--Congresses; Sevice life (Engineering)--Forecasting--Congresses; Electronic measurements--Congresses.

  
     
Relevance: 10.78%
 
     
 
         
         
Online Catalog
Basic Search
Advanced Search
Browse Subjects
Book Cart
 
         

Text Size:
S  -  M  -  L
Copyright © 2004-2025. Philippine eLib Project
Host: U.P. Diliman University Library