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  Search result  Your search for [subject]Semiconductors -- Testing -- Congresses returned 2 records.  
 
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  Book Recombination lifetime measurements in silicon.

West Conshohocken, PA: ASTM, 1998.

Subject: Semiconductors -- Testing -- Congresses; Service life (Engineering) -- Forecasting -- Congresses; Electronic measurements -- Congresses.

  
     
Relevance: 17.90%
 
     
  Book Recombination lifetime measurements in silicon.

West Conshohocken, PA: ASTM, 1998.

Subject: Semiconductors--Testing--Congresses; Sevice life (Engineering)--Forecasting--Congresses; Electronic measurements--Congresses.

  
     
Relevance: 17.90%
 
     
 
         
         
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